Aehr Test Systems to Participate in 22nd Annual Craig-Hallum Institutional Investor Conference

Reuters
21 May
<a href="https://laohu8.com/S/AEHR">Aehr Test Systems</a> to Participate in 22nd Annual Craig-Hallum Institutional Investor Conference

Aehr Test Systems, a global supplier of semiconductor test and burn-in equipment, will participate in the 22nd Annual Craig-Hallum Institutional Investor Conference on May 28, 2025, at the Depot Renaissance Hotel in Minneapolis. President and CEO Gayn Erickson will engage in one-on-one meetings with investors to discuss the company's innovative wafer level test and packaged part burn-in solutions for semiconductor production, highlighting their role in diverse markets including the AI semiconductor market.

Disclaimer: This news brief was created by Public Technologies (PUBT) using generative artificial intelligence. While PUBT strives to provide accurate and timely information, this AI-generated content is for informational purposes only and should not be interpreted as financial, investment, or legal advice. Aehr Test Systems published the original content used to generate this news brief via ACCESS Newswire (Ref. ID: 1030180) on May 21, 2025, and is solely responsible for the information contained therein.

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